CE-2
Agilent B1500 Semiconductor Analyzer
Nanofabrication Facility
MAKE
Agilent
MODEL
b1500
LOCATION
Cleanroom G07 LISE
Agilent B1500 Semiconductor Analyzer with B1520A-FG multi-frequency capacitance measurement unit (MF-CMU) for electrical property measurements of thin films and devices. Currently configured for 2-probe measurements.
Contact staff for training information.
Jason Tresback
617-496-1783
jtresback@cns.fas.harvard.edu
primary contact
Dr. Jiangdong Deng
617-495-3396
jdeng@cns.fas.harvard.edu