CE-2

Agilent B1500 Semiconductor Analyzer

Nanofabrication Facility

MAKE

Agilent

MODEL

b1500

LOCATION

Cleanroom G07 LISE

Agilent B1500 Semiconductor Analyzer with B1520A-FG multi-frequency capacitance measurement unit (MF-CMU) for electrical property measurements of thin films and devices. Currently configured for 2-probe measurements.

Contact staff for training information.

Jason Tresback

617-496-1783

jtresback@cns.fas.harvard.edu

primary contact

Dr. Jiangdong Deng

617-495-3396

jdeng@cns.fas.harvard.edu

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