Correlative Surface Analysis Workshop at Harvard CNS (Oct 4th-5th, 2022)

Correlative Surface Analysis Workshop– Latest developments in XPS and related tools for materials analysis 

Center for Nanoscale Systems Harvard University
October 4th from 9am – 3pm to October 5th from 9am – 12pm EDT

There are many ways to analyze the composition of a material, however the best results are found by collecting information from multiple avenues. In this LIVE workshop, we will focus on the latest developments in multi-technique surface analysis, particularly X-ray Photoelectron Spectroscopy (XPS) and Scanning Electron Microscopy with Energy Dispersive X-ray Spectroscopy (SEM/EDS). We will discuss the latest developments for these instruments, and how datasets from both techniques combine to give a more complete understanding of a sample.   

This workshop will introduce our new “CISA,” Correlated Imaging for Surface Analysis workflow, for combining the capabilities of XPS and SEM.  The first day of the workshop will include talks from local scientistsusing XPS including Thermo Fisher Scientific product specialists, Dr. James Lallo and Dr. Hugues Francois Saint-Cyr.

Robust interpretation of XPS results is as critical as the quality of the raw data.  The second day of the workshop will focus on XPS data interpretation and reporting through live guided tutorial.  Dr. Tim Nunney will provide instruction on XPS data reduction using the Thermo Scientific AVANTAGE™ software.  Example data sets and trial copies of the new AVANTAGE™ Version 6 will be provided to attendees of the tutorial. 


Day 1 Full day – Speakers
Dr. James Lallo – Thermo Fisher Scientific, Advances in XPS capabilities, and introduction of Correlated Imaging for Surface Analysis (CISA) 
Dr. Jennifer Lee – Harvard University 
Professor Xin Li – Harvard University SEAS
Kevin Hauser – Harvard University
Professor Elizabeth Landis – Holy Cross College
Dr. Hugues G. Francois Saint-Cyr – Thermo Fisher Scientific, Advances in integrated SEM-EDS


Day 2 Half day – Workshop
Educational Tutorial– XPS data analysis using Avantage V6 software
Dr. Robin Simpson, Thermo Fisher Scientific


Center for Nanoscale Systems Harvard University
11 Oxford St, Cambridge, MA 02138

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