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| Training: Zeiss SEM Part 1: Online training - Harvard Training Portal | | Trainer: Tim Cavanaugh | The SEM Part 1 training is available in an online format. You must pass this online training before taking the hands-on SEM training for our field emission Zeiss SEMs (FESEMs) or the EVO SEM. There is no sign-up required for the online training; you can access the training course from this link:
https://trainingportal.harvard.edu/Saba/Web_spf/NA1PRD0068/common/ledetail/cours000000000007001
PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW
Please note that this training requires a Harvard Key. If you are an external user and do not have a Harvard Key, please contact info@cns.fas.harvard.edu for details.
| | | | Training: B15A online safety training - Harvard Training Portal | | Trainer: Jules Gardener | CNS users who wish to use the instruments inside room B15A must complete the B15A safety training before gaining access to this room. The LISE B15A room safety training is available in an online format from https://trainingportal.harvard.edu/Saba/Web_spf/NA1PRD0068/app/shared;spf-url=common%2Fledetail%2Fcours000000000008101
Please copy this URL into your browser to take the training. We recommend using Chrome, Safari or Internet Explorer.
You must pass this online training before room access can be granted. There is no sign-up required for our online trainings and these can be taken by CNS users at any time.
Please note that only nominated and approved CNS Imaging Expert Users are eligible to gain access to this facility at this time. Any CNS User with a HU Key is eligible to take this training, but currently only designated Expert Users will gain access. Non-expert Users are still welcome to take this training, but access will not occur until CNS returns to normal operation. Any questions regarding the Covid-era Expert User program should be sent to: info@cns.fas.harvard.edu | | | | Training: Basic Arctica Cryo-EM course Day 2 - B58 control room | | Trainer: Svetla Stoilova-McPhie | Practicing of the Arctica Cryo-EM workflow.
PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW | | | | Training: Basic Arctica Cryo-EM course Day 3 - B58 Control room | | Trainer: Svetla Stoilova-McPhie | Practice and Certification to follow with Intermediate course
PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW | | | | Training: Basic Arctica Cryo-EM course, Day 1 - B58 control room | | Trainer: Svetla Stoilova-McPhie | CNS users will be demonstrated the Basic operation of our Tecnai Arctica Cryo-TEM workflow and have their own area set up to practice.
PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW | | | | Training: Cryo-TEM sample preparation - GO5 | | Trainer: Svetla Stoilova-McPhie | CNS users will be trained to use the Vitorbot Mark IV to freeze their samples.
CNS users need to do the training for GO5 (2h) with Sandra Nacasone, (snakasone@cns.fas.harvard.edu) to use the equipment.
PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW | | | | Training: HAR-053 sputter coater training (online) - Harvard Training Portal | | Trainer: Jules Gardener | This training is for the EMS sputter coaters located in the CNS Imaging sample preparation room (LISE B15A). These tools are optimized for coating SEM samples with a thin conductive layer. These coaters cannot be used for coating thick (>20nm) films. Pt/Pd and Au coatings are available.
Sputter coater training is available in an online format for these tools. You must pass this online training, and have completed the B15A room safety training (also available online), before access to the sputter coaters can be granted. Once you have completed these requirements, you will have access to both sputter coaters. There is no sign-up required for our online trainings and these can be taken by CNS users at any time. You can access the sputter coater training course at https://trainingportal.harvard.edu/Saba/Web_spf/NA1PRD0068/common/leclassview/dowbt000000000004421
Please copy this URL into your browser to take the training. We recommend using Chrome, Safari or Internet Explorer.
Please note that only nominated and approved CNS Imaging Expert Users are eligible to gain access to this facility at this time. Any CNS User with a HU Key is eligible to take this training, but currently only designated Expert Users will gain access. Non-expert Users are still welcome to take this training, but access will not occur until CNS returns to normal operation. Any questions regarding the Covid-era Expert User program should be sent to: info@cns.fas.harvard.edu | | | | Training: Intermediate Arctica Cryo-EM course Day 1 - B58 Control room | | Trainer: Svetla Stoilova-McPhie | The Intermediate Arctica Cryo-EM course has to be taken the week after the Basic Cryo-EM course.
It will consist of working with a standard Cryo-EM sample (vesicle and Apoferritin).
PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW | | | | Training: Online TEM training course - Harvard Training Portal | | Trainer: Jules Gardener | This is a new online training which is required as the first step of TEM training for the JEOL 2100 and Hitachi 7800 instruments. This training will provide an introduction to TEM concepts and background about our TEMs. You must pass the assessment at the end of this online course before attending an in-person TEM training on the JEOL 2100 or Hitachi 7800 instruments. There is no sign-up required for the online training; you can access the training course from this link:
https://trainingportal.harvard.edu/Saba/Web_spf/NA1PRD0068/common/ledetail/cours000000000010142
Please note that only nominated and approved CNS Imaging Expert Users are eligible to gain access to this facility at this time. Any CNS User with a HU Key is eligible to take this training, but currently only designated Expert Users will gain access. Non-expert Users are still welcome to take this training, but access will not occur until CNS returns to normal operation. Any questions regarding the Covid-era Expert User program should be sent to: info@cns.fas.harvard.edu | | | | Training: VPO - Photo Bay | | Trainer: Malcolm Tse | | Auto coating oven for HMDS | | |
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| Training: Cleanroom Orientation - in front G07 | | Trainer: John Tsakirgis | | To understand the Safety and operation protocols of CNS Cleanroom | | Time | Max Attendees | Available | CNS Users ONLY |
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10:00 am - 11:00 am
Please be prompt | 1 | FULL | Registration Closed | | | | Training: Cypher S/ES and MFP3d BiO Atomic Force Microscopy (AFM) Training Part-1 (SPM-2 & 6) - LISE B58 | | Trainer: Jason Tresback | | This training event will focus on the basic imaging and operation of the Cypher S/ES and MFP3D BiO AFM’s available at CNS (SPM- 2 and 6). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day | | Time | Max Attendees | Available | CNS Users ONLY |
|---|
1:00 pm - 2:00 pm
| 2 | 1 | Register! | | | | Training: Metrology for Nanofabrication Part-1 (Stylus Profilometry, Ellipsometry, and Electrical Property Measurements) - LISE G07 Nanofabrication Cleanroom | | Trainer: Jason Tresback | | This metrology part-1 training event will focus on fundamental measurement tools for nanofabrication including, contact/stylus surface Profilometer (DekTak XT and 6m) (PL-5/8), single wavelength scanning Ellipsometer (Gaertner-LSE) (ES-2), scanning sheet resistance mapping (CDE-ResMap 4-Pt Probe system) (MET-2), and Semiconductor Parameter Analyzer w/ Signatone 4-Pt Probe Station (Agilent 4156C & Signatone 4pt Probe Station)(PB-1 & CE-1/2). Full independent access to these tools listed above can be achieved, however the amount of time spent on each tool will vary based on participants. We meet inside the Cleanroom gowning area or within the Metrology Bay inside the CNS cleanroom (G07). | | Time | Max Attendees | Available | LISE Cleanroom Users ONLY |
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10:30 am - 12:00 pm
| 2 | 1 | Register! | | | | Training: RIE 8 STS ICP RIE Training - CNS Cleanroom at the tool | | Trainer: Ling Xie | This will be a remote training. Please bring a laptop and an earphone with you and come to the tool on time.
Ling Xie is inviting you to a scheduled Zoom meeting.
Topic: Zoom Meeting for training
Time: This is a recurring meeting Meet anytime
Join Zoom meeting
https://harvard.zoom.us/j/99096815765?pwd=NGo3N2xocTV5T0hIRXdWcW80Y1NzUT09
Password: 315648
Join by telephone (use any number to dial in)
+1 312 626 6799
+1 929 436 2866
+1 301 715 8592
+1 346 248 7799
+1 669 900 6833
+1 253 215 8782
International numbers available: https://harvard.zoom.us/u/abwNsmaaBL
One tap mobile: +13126266799,,99096815765# US (Chicago)
Join by SIP conference room system
Meeting ID: 990 9681 5765
99096815765@zoomcrc.com
| | Time | Max Attendees | Available | LISE Cleanroom Users ONLY |
|---|
1:00 pm - 2:30 pm
| 1 | FULL | Registration Closed | | |
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| Training: Cleanroom Orientation - in front G07 | | Trainer: John Tsakirgis | | To understand the Safety and operation protocols of CNS Cleanroom | | Time | Max Attendees | Available | CNS Users ONLY |
|---|
10:00 am - 11:00 am
Please be prompt | 1 | 1 | Register! | | | | Training: cleanroom orientation - meet in front of G07 | | Trainer: John Tsakirgis | | To understand Safety and operation protocols of CNS cleanroom | | Time | Max Attendees | Available | CNS Users ONLY |
|---|
9:00 am - 10:00 am
Please be on time | 1 | 1 | Register! | | |
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| Training: Asylum Cypher S/ES and MFP3d BiO/SA Atomic Force Microscopy Training Part-1 (SPM-2 & 6) - LISE B58 | | Trainer: Jason Tresback | | This training event will focus on the basic imaging and operation of the Cypher S/ES and MFP3D BiO AFM’s available at CNS (SPM- 2 and 6). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day | | Time | Max Attendees | Available | CNS Users ONLY |
|---|
1:00 pm - 2:00 pm
| 2 | 2 | Register! | | | | Training: Jupiter XR Atomic Force Microscopy (AFM) Training Part-1 (SPM-12) - | | Trainer: Jason Tresback | | This training event will focus on the basic imaging and operation of the Jupiter XR AFM available inside the Nanofabrication Cleanroom (SPM-12). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day. | | Time | Max Attendees | Available | LISE Cleanroom Users ONLY |
|---|
3:00 pm - 4:00 pm
| 2 | 2 | Register! | | | | Training: Metrology for Nanofabrication Part-1 (Stylus Profilometry, Ellipsometry, and Electrical Property Measurements) - LISE G07 Nanofabrication Cleanroom | | Trainer: Jason Tresback | | This metrology part-1 training event will focus on fundamental measurement tools for nanofabrication including, contact/stylus surface Profilometer (DekTak XT and 6m) (PL-5/8), single wavelength scanning Ellipsometer (Gaertner-LSE) (ES-2), scanning sheet resistance mapping (CDE-ResMap 4-Pt Probe system) (MET-2), and Semiconductor Parameter Analyzer w/ Signatone 4-Pt Probe Station (Agilent 4156C & Signatone 4pt Probe Station)(PB-1 & CE-1/2). Full independent access to these tools listed above can be achieved, however the amount of time spent on each tool will vary based on participants. We meet inside the Cleanroom gowning area or within the Metrology Bay inside the CNS cleanroom (G07). | | Time | Max Attendees | Available | LISE Cleanroom Users ONLY |
|---|
10:30 am - 12:00 pm
| 2 | 1 | Register! | | |
|
|
| Training: Cleanroom Orientation - in front G07 | | Trainer: John Tsakirgis | | To understand the Safety and operation protocols of CNS Cleanroom | | Time | Max Attendees | Available | CNS Users ONLY |
|---|
10:00 am - 11:00 am
Please be prompt | 1 | 1 | Register! | | | | Training: cleanroom orientation - meet in front of G07 | | Trainer: John Tsakirgis | | To understand Safety and operation protocols of CNS cleanroom | | Time | Max Attendees | Available | CNS Users ONLY |
|---|
9:00 am - 10:00 am
Please be on time | 1 | 1 | Register! | | |
|
|
| Training: Cypher S/ES and MFP3d BiO Atomic Force Microscopy (AFM) Training Part-1 (SPM-2 & 6) - LISE B58 | | Trainer: Jason Tresback | | This training event will focus on the basic imaging and operation of the Cypher S/ES and MFP3D BiO AFM’s available at CNS (SPM- 2 and 6). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day | | Time | Max Attendees | Available | CNS Users ONLY |
|---|
1:00 pm - 2:00 pm
| 2 | 2 | Register! | | | | Training: Metrology for Nanofabrication Part-1 (Stylus Profilometry, Ellipsometry, and Electrical Property Measurements) - LISE G07 Nanofabrication Cleanroom | | Trainer: Jason Tresback | | This metrology part-1 training event will focus on fundamental measurement tools for nanofabrication including, contact/stylus surface Profilometer (DekTak XT and 6m) (PL-5/8), single wavelength scanning Ellipsometer (Gaertner-LSE) (ES-2), scanning sheet resistance mapping (CDE-ResMap 4-Pt Probe system) (MET-2), and Semiconductor Parameter Analyzer w/ Signatone 4-Pt Probe Station (Agilent 4156C & Signatone 4pt Probe Station)(PB-1 & CE-1/2). Full independent access to these tools listed above can be achieved, however the amount of time spent on each tool will vary based on participants. We meet inside the Cleanroom gowning area or within the Metrology Bay inside the CNS cleanroom (G07). | | Time | Max Attendees | Available | LISE Cleanroom Users ONLY |
|---|
10:30 am - 12:00 pm
| 3 | 2 | Register! | | | | Training: RIE 8 STS ICP RIE Training - CNS Cleanroom at the tool | | Trainer: Ling Xie | This will be a remote training. Please bring a laptop and an earphone with you and come to the tool on time.
Ling Xie is inviting you to a scheduled Zoom meeting.
Topic: Zoom Meeting for training
Time: This is a recurring meeting Meet anytime
Join Zoom meeting
https://harvard.zoom.us/j/99096815765?pwd=NGo3N2xocTV5T0hIRXdWcW80Y1NzUT09
Password: 315648
Join by telephone (use any number to dial in)
+1 312 626 6799
+1 929 436 2866
+1 301 715 8592
+1 346 248 7799
+1 669 900 6833
+1 253 215 8782
International numbers available: https://harvard.zoom.us/u/abwNsmaaBL
One tap mobile: +13126266799,,99096815765# US (Chicago)
Join by SIP conference room system
Meeting ID: 990 9681 5765
99096815765@zoomcrc.com
| | Time | Max Attendees | Available | LISE Cleanroom Users ONLY |
|---|
1:00 pm - 2:30 pm
| 1 | FULL | Registration Closed | | |
|
|
| Training: Asylum Cypher S/ES and MFP3d BiO/SA Atomic Force Microscopy Training Part-1 (SPM-2 & 6) - LISE B58 | | Trainer: Jason Tresback | | This training event will focus on the basic imaging and operation of the Cypher S/ES and MFP3D BiO AFM’s available at CNS (SPM- 2 and 6). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day | | Time | Max Attendees | Available | CNS Users ONLY |
|---|
1:00 pm - 2:00 pm
| 2 | 2 | Register! | | | | Training: Jupiter XR Atomic Force Microscopy (AFM) Training Part-1 (SPM-12) - | | Trainer: Jason Tresback | | This training event will focus on the basic imaging and operation of the Jupiter XR AFM available inside the Nanofabrication Cleanroom (SPM-12). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day. | | Time | Max Attendees | Available | LISE Cleanroom Users ONLY |
|---|
3:00 pm - 4:00 pm
| 2 | 1 | Register! | | | | Training: Metrology for Nanofabrication Part-1 (Stylus Profilometry, Ellipsometry, and Electrical Property Measurements) - LISE G07 Nanofabrication Cleanroom | | Trainer: Jason Tresback | | This metrology part-1 training event will focus on fundamental measurement tools for nanofabrication including, contact/stylus surface Profilometer (DekTak XT and 6m) (PL-5/8), single wavelength scanning Ellipsometer (Gaertner-LSE) (ES-2), scanning sheet resistance mapping (CDE-ResMap 4-Pt Probe system) (MET-2), and Semiconductor Parameter Analyzer w/ Signatone 4-Pt Probe Station (Agilent 4156C & Signatone 4pt Probe Station)(PB-1 & CE-1/2). Full independent access to these tools listed above can be achieved, however the amount of time spent on each tool will vary based on participants. We meet inside the Cleanroom gowning area or within the Metrology Bay inside the CNS cleanroom (G07). | | Time | Max Attendees | Available | LISE Cleanroom Users ONLY |
|---|
10:30 am - 12:00 pm
| 2 | 1 | Register! | | |
|