All in-person trainings that CNS offers are listed in one of three categories. They are as follows:

Open Event: Any training with this designation is not charged and one does not require a CNS User Name and password in order to register. As a result, you can sign-up for any training with this designation even prior to completion of the CNS User enrollment process.

CNS Users Only: Trainings under this training designation do require an active CNS UN and PW. One must have completed the CNS User enrollment process and received the new user confirmation email in order to attend a training of this designation.

LISE Cleanroom Users Only: Trainings under this designation require, in addition to having a CNS UN and PW, that one be fully cleanroom qualified before one can sign-up. Information on how to become cleanroom qualified can be found in the User Info section of the website under the Nanofabrication Facility Use tab.

CNS does offer some trainings online through the Harvard University Training Portal. They will be listed below and do not require advance sign-up. Online trainings at the portal do require a Harvard Key. If you are a Non-Harvard User who does not have a HUID or HU Key, you will get one as part of the enrollment process.

The LISE CNS Safety Training, which is required as part of the enrollment process, is not listed as it is held at fixed times. Please see the Become a CNS User tab of the CNS web site for more info regarding that training.

Important information regarding training pre-requisite requirements and training pathways for specific instrumentation can be found in the User Info section of the CNS website under the tabs: Nanofabrication Facility Use and Imaging and Analysis Facility Use.

If you cannot find a training for something you are interested in receiving training on at CNS, please see the instrument sections of our website to find the technical staff member who manages it and contact them directly. If you cannot figure out who to contact regarding training, please contact us at info@cns.fas.harvard.edu

It is CNS policy that CNS Users only sign-up for trainings that they plan to attend. It is not permitted for a CNS User to sign-up for a groupmate or other party as a placeholder.

CNS Training Events - Registration Page


(Important information - please read)
 
  • Open Events
  • CNS Users Only
  • LISE Cleanroom Users Only
  • Month
Date TBD - you can pre-register for this training session.
CNS staff will notify you when a date has been set.
Training: Zeiss SEM Part 1: Online training - Harvard Training Portal
Trainer: Tim Cavanaugh
The SEM Part 1 training is available in an online format. You must pass this online training before taking the hands-on SEM training for our field emission Zeiss SEMs (FESEMs) or the EVO SEM. There is no sign-up required for the online training; you can access the training course from this link:
https://trainingportal.harvard.edu/Saba/Web_spf/NA1PRD0068/common/ledetail/cours000000000007001

PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW

Please note that this training requires a Harvard Key. If you are an external user and do not have a Harvard Key, please contact info@cns.fas.harvard.edu for details.
 
Training: B15A online safety training - Harvard Training Portal
Trainer: Jules Gardener
CNS users who wish to use the instruments inside room B15A must complete the B15A safety training before gaining access to this room. The LISE B15A room safety training is available in an online format from https://trainingportal.harvard.edu/Saba/Web_spf/NA1PRD0068/app/shared;spf-url=common%2Fledetail%2Fcours000000000008101
Please copy this URL into your browser to take the training. We recommend using Chrome, Safari or Internet Explorer.

You must pass this online training before room access can be granted. There is no sign-up required for our online trainings and these can be taken by CNS users at any time.

Please note that only nominated and approved CNS Imaging Expert Users are eligible to gain access to this facility at this time. Any CNS User with a HU Key is eligible to take this training, but currently only designated Expert Users will gain access. Non-expert Users are still welcome to take this training, but access will not occur until CNS returns to normal operation. Any questions regarding the Covid-era Expert User program should be sent to: info@cns.fas.harvard.edu
 
Training: Basic Arctica Cryo-EM course Day 2 - B58 control room
Trainer: Svetla Stoilova-McPhie
Practicing of the Arctica Cryo-EM workflow.

PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW
 
Training: Basic Arctica Cryo-EM course Day 3 - B58 Control room
Trainer: Svetla Stoilova-McPhie
Practice and Certification to follow with Intermediate course

PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW
 
Training: Basic Arctica Cryo-EM course, Day 1 - B58 control room
Trainer: Svetla Stoilova-McPhie
CNS users will be demonstrated the Basic operation of our Tecnai Arctica Cryo-TEM workflow and have their own area set up to practice.

PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW
 
Training: Cryo-TEM sample preparation - GO5
Trainer: Svetla Stoilova-McPhie
CNS users will be trained to use the Vitorbot Mark IV to freeze their samples.
CNS users need to do the training for GO5 (2h) with Sandra Nacasone, (snakasone@cns.fas.harvard.edu) to use the equipment.

PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW
 
Training: HAR-053 sputter coater training (online) - Harvard Training Portal
Trainer: Jules Gardener
This training is for the EMS sputter coaters located in the CNS Imaging sample preparation room (LISE B15A). These tools are optimized for coating SEM samples with a thin conductive layer. These coaters cannot be used for coating thick (>20nm) films. Pt/Pd and Au coatings are available.

Sputter coater training is available in an online format for these tools. You must pass this online training, and have completed the B15A room safety training (also available online), before access to the sputter coaters can be granted. Once you have completed these requirements, you will have access to both sputter coaters. There is no sign-up required for our online trainings and these can be taken by CNS users at any time. You can access the sputter coater training course at https://trainingportal.harvard.edu/Saba/Web_spf/NA1PRD0068/common/leclassview/dowbt000000000004421

Please copy this URL into your browser to take the training. We recommend using Chrome, Safari or Internet Explorer.

Please note that only nominated and approved CNS Imaging Expert Users are eligible to gain access to this facility at this time. Any CNS User with a HU Key is eligible to take this training, but currently only designated Expert Users will gain access. Non-expert Users are still welcome to take this training, but access will not occur until CNS returns to normal operation. Any questions regarding the Covid-era Expert User program should be sent to: info@cns.fas.harvard.edu
 
Training: Intermediate Arctica Cryo-EM course Day 1 - B58 Control room
Trainer: Svetla Stoilova-McPhie
The Intermediate Arctica Cryo-EM course has to be taken the week after the Basic Cryo-EM course.
It will consist of working with a standard Cryo-EM sample (vesicle and Apoferritin).

PLEASE NOTE THAT THIS TRAINING IS ONLY FOR FULLY ENROLLED CNS USERS. IF YOU ARE LOOKING FOR THE FREE CNS IMAGING GROUP MASTERCLASS WEBINARS, PLEASE SEE FURTHER BELOW
 
Training: Online TEM training course - Harvard Training Portal
Trainer: Jules Gardener
This is a new online training which is required as the first step of TEM training for the JEOL 2100 and Hitachi 7800 instruments. This training will provide an introduction to TEM concepts and background about our TEMs. You must pass the assessment at the end of this online course before attending an in-person TEM training on the JEOL 2100 or Hitachi 7800 instruments. There is no sign-up required for the online training; you can access the training course from this link:
https://trainingportal.harvard.edu/Saba/Web_spf/NA1PRD0068/common/ledetail/cours000000000010142

Please note that only nominated and approved CNS Imaging Expert Users are eligible to gain access to this facility at this time. Any CNS User with a HU Key is eligible to take this training, but currently only designated Expert Users will gain access. Non-expert Users are still welcome to take this training, but access will not occur until CNS returns to normal operation. Any questions regarding the Covid-era Expert User program should be sent to: info@cns.fas.harvard.edu
 
Training: VPO - Photo Bay
Trainer: Malcolm Tse
Auto coating oven for HMDS
 
Monday, June 21st, 2021
Training: Cleanroom Orientation - in front G07
Trainer: John Tsakirgis
To understand the Safety and operation protocols of CNS Cleanroom
TimeMax AttendeesAvailableCNS Users ONLY
10:00 am - 11:00 am
Please be prompt
1FULLRegistration Closed
 
Training: Cypher S/ES and MFP3d BiO Atomic Force Microscopy (AFM) Training Part-1 (SPM-2 & 6) - LISE B58
Trainer: Jason Tresback
This training event will focus on the basic imaging and operation of the Cypher S/ES and MFP3D BiO AFMs available at CNS (SPM- 2 and 6). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day
TimeMax AttendeesAvailableCNS Users ONLY
1:00 pm - 2:00 pm
21Register!
 
Training: Metrology for Nanofabrication Part-1 (Stylus Profilometry, Ellipsometry, and Electrical Property Measurements) - LISE G07 Nanofabrication Cleanroom
Trainer: Jason Tresback
This metrology part-1 training event will focus on fundamental measurement tools for nanofabrication including, contact/stylus surface Profilometer (DekTak XT and 6m) (PL-5/8), single wavelength scanning Ellipsometer (Gaertner-LSE) (ES-2), scanning sheet resistance mapping (CDE-ResMap 4-Pt Probe system) (MET-2), and Semiconductor Parameter Analyzer w/ Signatone 4-Pt Probe Station (Agilent 4156C & Signatone 4pt Probe Station)(PB-1 & CE-1/2). Full independent access to these tools listed above can be achieved, however the amount of time spent on each tool will vary based on participants. We meet inside the Cleanroom gowning area or within the Metrology Bay inside the CNS cleanroom (G07).
TimeMax AttendeesAvailableLISE Cleanroom Users ONLY
10:30 am - 12:00 pm
21Register!
 
Training: RIE 8 STS ICP RIE Training - CNS Cleanroom at the tool
Trainer: Ling Xie
This will be a remote training. Please bring a laptop and an earphone with you and come to the tool on time.

Ling Xie is inviting you to a scheduled Zoom meeting.

Topic: Zoom Meeting for training
Time: This is a recurring meeting Meet anytime

Join Zoom meeting
https://harvard.zoom.us/j/99096815765?pwd=NGo3N2xocTV5T0hIRXdWcW80Y1NzUT09

Password: 315648

Join by telephone (use any number to dial in)
+1 312 626 6799
+1 929 436 2866
+1 301 715 8592
+1 346 248 7799
+1 669 900 6833
+1 253 215 8782

International numbers available: https://harvard.zoom.us/u/abwNsmaaBL

One tap mobile: +13126266799,,99096815765# US (Chicago)

Join by SIP conference room system
Meeting ID: 990 9681 5765
99096815765@zoomcrc.com
TimeMax AttendeesAvailableLISE Cleanroom Users ONLY
1:00 pm - 2:30 pm
1FULLRegistration Closed
 
Tuesday, June 22nd, 2021
Training: Cleanroom Orientation - in front G07
Trainer: John Tsakirgis
To understand the Safety and operation protocols of CNS Cleanroom
TimeMax AttendeesAvailableCNS Users ONLY
10:00 am - 11:00 am
Please be prompt
11Register!
 
Training: cleanroom orientation - meet in front of G07
Trainer: John Tsakirgis
To understand Safety and operation protocols of CNS cleanroom
TimeMax AttendeesAvailableCNS Users ONLY
9:00 am - 10:00 am
Please be on time
11Register!
 
Wednesday, June 23rd, 2021
Training: Asylum Cypher S/ES and MFP3d BiO/SA Atomic Force Microscopy Training Part-1 (SPM-2 & 6) - LISE B58
Trainer: Jason Tresback
This training event will focus on the basic imaging and operation of the Cypher S/ES and MFP3D BiO AFMs available at CNS (SPM- 2 and 6). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day
TimeMax AttendeesAvailableCNS Users ONLY
1:00 pm - 2:00 pm
22Register!
 
Training: Jupiter XR Atomic Force Microscopy (AFM) Training Part-1 (SPM-12) -
Trainer: Jason Tresback
This training event will focus on the basic imaging and operation of the Jupiter XR AFM available inside the Nanofabrication Cleanroom (SPM-12). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day.
TimeMax AttendeesAvailableLISE Cleanroom Users ONLY
3:00 pm - 4:00 pm
22Register!
 
Training: Metrology for Nanofabrication Part-1 (Stylus Profilometry, Ellipsometry, and Electrical Property Measurements) - LISE G07 Nanofabrication Cleanroom
Trainer: Jason Tresback
This metrology part-1 training event will focus on fundamental measurement tools for nanofabrication including, contact/stylus surface Profilometer (DekTak XT and 6m) (PL-5/8), single wavelength scanning Ellipsometer (Gaertner-LSE) (ES-2), scanning sheet resistance mapping (CDE-ResMap 4-Pt Probe system) (MET-2), and Semiconductor Parameter Analyzer w/ Signatone 4-Pt Probe Station (Agilent 4156C & Signatone 4pt Probe Station)(PB-1 & CE-1/2). Full independent access to these tools listed above can be achieved, however the amount of time spent on each tool will vary based on participants. We meet inside the Cleanroom gowning area or within the Metrology Bay inside the CNS cleanroom (G07).
TimeMax AttendeesAvailableLISE Cleanroom Users ONLY
10:30 am - 12:00 pm
21Register!
 
Thursday, June 24th, 2021
Training: Cleanroom Orientation - in front G07
Trainer: John Tsakirgis
To understand the Safety and operation protocols of CNS Cleanroom
TimeMax AttendeesAvailableCNS Users ONLY
10:00 am - 11:00 am
Please be prompt
11Register!
 
Training: cleanroom orientation - meet in front of G07
Trainer: John Tsakirgis
To understand Safety and operation protocols of CNS cleanroom
TimeMax AttendeesAvailableCNS Users ONLY
9:00 am - 10:00 am
Please be on time
11Register!
 
Monday, June 28th, 2021
Training: Cypher S/ES and MFP3d BiO Atomic Force Microscopy (AFM) Training Part-1 (SPM-2 & 6) - LISE B58
Trainer: Jason Tresback
This training event will focus on the basic imaging and operation of the Cypher S/ES and MFP3D BiO AFMs available at CNS (SPM- 2 and 6). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day
TimeMax AttendeesAvailableCNS Users ONLY
1:00 pm - 2:00 pm
22Register!
 
Training: Metrology for Nanofabrication Part-1 (Stylus Profilometry, Ellipsometry, and Electrical Property Measurements) - LISE G07 Nanofabrication Cleanroom
Trainer: Jason Tresback
This metrology part-1 training event will focus on fundamental measurement tools for nanofabrication including, contact/stylus surface Profilometer (DekTak XT and 6m) (PL-5/8), single wavelength scanning Ellipsometer (Gaertner-LSE) (ES-2), scanning sheet resistance mapping (CDE-ResMap 4-Pt Probe system) (MET-2), and Semiconductor Parameter Analyzer w/ Signatone 4-Pt Probe Station (Agilent 4156C & Signatone 4pt Probe Station)(PB-1 & CE-1/2). Full independent access to these tools listed above can be achieved, however the amount of time spent on each tool will vary based on participants. We meet inside the Cleanroom gowning area or within the Metrology Bay inside the CNS cleanroom (G07).
TimeMax AttendeesAvailableLISE Cleanroom Users ONLY
10:30 am - 12:00 pm
32Register!
 
Training: RIE 8 STS ICP RIE Training - CNS Cleanroom at the tool
Trainer: Ling Xie
This will be a remote training. Please bring a laptop and an earphone with you and come to the tool on time.

Ling Xie is inviting you to a scheduled Zoom meeting.

Topic: Zoom Meeting for training
Time: This is a recurring meeting Meet anytime

Join Zoom meeting
https://harvard.zoom.us/j/99096815765?pwd=NGo3N2xocTV5T0hIRXdWcW80Y1NzUT09

Password: 315648

Join by telephone (use any number to dial in)
+1 312 626 6799
+1 929 436 2866
+1 301 715 8592
+1 346 248 7799
+1 669 900 6833
+1 253 215 8782

International numbers available: https://harvard.zoom.us/u/abwNsmaaBL

One tap mobile: +13126266799,,99096815765# US (Chicago)

Join by SIP conference room system
Meeting ID: 990 9681 5765
99096815765@zoomcrc.com
TimeMax AttendeesAvailableLISE Cleanroom Users ONLY
1:00 pm - 2:30 pm
1FULLRegistration Closed
 
Wednesday, June 30th, 2021
Training: Asylum Cypher S/ES and MFP3d BiO/SA Atomic Force Microscopy Training Part-1 (SPM-2 & 6) - LISE B58
Trainer: Jason Tresback
This training event will focus on the basic imaging and operation of the Cypher S/ES and MFP3D BiO AFMs available at CNS (SPM- 2 and 6). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day
TimeMax AttendeesAvailableCNS Users ONLY
1:00 pm - 2:00 pm
22Register!
 
Training: Jupiter XR Atomic Force Microscopy (AFM) Training Part-1 (SPM-12) -
Trainer: Jason Tresback
This training event will focus on the basic imaging and operation of the Jupiter XR AFM available inside the Nanofabrication Cleanroom (SPM-12). Starting from the basic principles of AFM, users will also learn about cantilever selection and installation, different imaging modes, image quality improvement, and data processing and analysis methods. SPM probes are provided for training; however, users must supply their own probes during independent use. Full independent tool access requires completion of part-1 basic imaging and operation demonstrated by staff, followed by part-2 individual user assisted session that serves as a qualification for independent use on another day.
TimeMax AttendeesAvailableLISE Cleanroom Users ONLY
3:00 pm - 4:00 pm
21Register!
 
Training: Metrology for Nanofabrication Part-1 (Stylus Profilometry, Ellipsometry, and Electrical Property Measurements) - LISE G07 Nanofabrication Cleanroom
Trainer: Jason Tresback
This metrology part-1 training event will focus on fundamental measurement tools for nanofabrication including, contact/stylus surface Profilometer (DekTak XT and 6m) (PL-5/8), single wavelength scanning Ellipsometer (Gaertner-LSE) (ES-2), scanning sheet resistance mapping (CDE-ResMap 4-Pt Probe system) (MET-2), and Semiconductor Parameter Analyzer w/ Signatone 4-Pt Probe Station (Agilent 4156C & Signatone 4pt Probe Station)(PB-1 & CE-1/2). Full independent access to these tools listed above can be achieved, however the amount of time spent on each tool will vary based on participants. We meet inside the Cleanroom gowning area or within the Metrology Bay inside the CNS cleanroom (G07).
TimeMax AttendeesAvailableLISE Cleanroom Users ONLY
10:30 am - 12:00 pm
21Register!
 

Logins

doubleArrow-right