The JEOL TEM/STEM is a field emission transmission electron microscope for imaging solid materials that can perform high resolution lattice imaging in TEM mode or annular-dark field (ADF) imaging in STEM (scanning) mode. An Energy Dispersive X-ray Spectroscopy (EDS) detector is available for both point and mapping modes. A side-mounted diffraction camera can be used to obtain diffraction patterns without a beam stop. Lattice resolution is 0.19nm pt-to-pt in TEM mode and STEM probe resolution is 0.2nm. This instrument can be used at 200kV, 120kV, 80kV and 60kV.

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