TEM-11
JEOL ARM 200F STEM
Imaging and Analysis
MAKE
JEOL
MODEL
ARM 200F
LOCATION
LISE B15B
This ultra-high resolution analytical scanning transmission electron microscope (STEM) has a cold field emission gun (FEG) and integrated aberration (Cs) corrector. It is equipped with bright field (BF), annular dark field (ADF), energy dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) detectors. This STEM achieves a HAADF STEM resolution of 78 picometers at 200kV and energy resolution of 0.33eV at 200kV.
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Training is available for advanced TEM users, who have demonstrated their capabilities on our other TEMs. This instrument is not suitable for novice users.
Jules Gardener
jgardener@cns.fas.harvard.edu
primary contact
Adam Graham
agraham@cns.fas.harvard.edu