Resolution: 7 Å @ 1kV, 6 Å @ 15kV, 6 Å in STEM
Analytical resolution: sub 30 nm scale
Probe current: >500nA
High sensitivity BE detector providing exceptional performance at low accelerating voltages
Ultralow kV in-lens detectors
GBSH-S (GENTLEBEAM™ Super High mode) enabling high resolution imaging at extremely low accelerating voltages (down to 10V)
System has Oxford EDS and WDS spectrometers fitted.

The JEOL JSM 7900F Schottky FE-SEM enables high resolution surface examination and accurate determination of chemical composition using EDS and WDS. This SEM uses a low to moderate energy (0.01 to 30 keV) electron beam to image a sample in high vacuum with sub-nanometer resolution. The tool also has an available low vacuum mode for imaging of non-conductive specimens, as well as Gentle Beam technology to provide a positive bias to the sample stage to reduce landing energy. Detectors available for imaging include: Through the Lens SE; Everhart-Thornley; Retractable backscatter detector; low-vacuum backscatter. Analytical capabilities are based on the equipped Oxford Ultim Max EDS Detector; Oxford Wave WDS detector; Oxford Symmetry EBSD system.

Click here to view this tool in the CNS virtual reality model.