SEC-SEM-4
FESEM Zeiss Ultra55
Imaging and Analysis
MAKE
Zeiss
MODEL
Ultra55
LOCATION
Allston SEC Imaging Suite LL2.301-03
The Ultra55 Field Emission Scanning Electron Microscope (FESEM) enables high resolution surface examination. This SEM has a cross-over free Zeiss Gemini column, and uses a low to moderate energy (0.1 to 30 keV) electron beam to image a sample in high vacuum with resolution of 1nm at 15 keV and 1.7 nm at 1 keV. Detectors available: In-lens SE, Everhart-Thornley, EsB (Energy selective Backscattered electron detector), EDS detector.
Click here to view this tool in the CNS virtual reality model (in the model, the tool is still in the Cambridge facility, but it has now been moved to the Allston SEC facility).
Our FESEM training procedure comprises three parts: an online course, a hands-on training and a certification. The online training can be accessed by users with a Harvard Key here (non-Harvard users without a Harvard Key should contact us [info@cns.fas.harvard.edu] for assistance). Please contact staff for more details on our SEM training program.
Adam Graham
agraham@cns.fas.harvard.edu
primary contact
Tim Cavanaugh
tcavanaugh@fas.harvard.edu
Nicki Watson
nwatson2@fas.harvard.edu