SEC-SPM-13
JPK Nanowizard AFM
NanoMaterials Facility
MAKE
Bruker
MODEL
Nanowizard
LOCATION
Allston SEC Materials Core LL2.226-03
The AFM measures the mechanical properties of surfaces, with up to 100 x 100 um lateral range and a maximum peak-to-valley height variation of 15 um. Matching cantilever stiffness and/or probe geometry with the sample properties is essential for obtaining accurate data (see “Cantilever Selection and Sample Prep Considerations”). Users must provide their own probes for measurement.
Nicholas S. Colella
colella@fas.harvard.edu
primary contact