SEC-OL-10
ABM Mask Aligner
NanoMaterials Facility
MAKE
AB-M
MODEL
ABM/8"/500w/NUV/DCCD/SEMI AUTO
LOCATION
Allston SEC Soft Lithography 2.125
This mask alignment and exposure system has a table-top configuration and offers Near UV (365nm (I line) and 400nm (H line)) exposure capabilities. It is a contact aligner with precision x, y, z and substrate rotation controls. It has a dual-field high magnification microscope for alignment. We provide two circular vacuum chucks capable of processing 3”/4” and 6”/8” wafers with Wedge Compensation (Planarizing) feature. The aligner has two mask holders for 5”x5” and 9”x9” sized masks, ideal for 3”/4” and 6”/8” wafers respectively. The minimum feature size that can be achieved on this system is about 2 micrometers. However, the practical limit will ultimately depend on the mask resolution, the photoresist type, thickness, uniformity, and the level of contact between the photoresist layer and the mask.
Contact Jiten Narang (jnarangATfas.harvard.edu) for training on any tools in the SEC Soft Lith Lab.
Hao-Yu (Greg) Lin
hlin@cns.fas.harvard.edu
primary contact
Cathleen Hallinan
cathleen_hallinan@fas.harvard.edu