The SPECS LEEM instrument FE-LEEM P90 AC is a next generation Low Energy Electron Microscope with integrated aberration correction, showing 2 nm resolution for dynamic LEEM microscopy experiments. Both image and LEED pattern are transferred without the negative effects of chromatic dispersion, offering superior image and diffraction capabilities. A sophisticated energy filter enables imaging with an energy resolution down to 250 meV with a minimal impact on the high spatial resolution of the instrument.  Capable of REED, LEED, Energy filtered PEEM with focusing UV source UVS 300 and ARPES measurement capability.  Users should quote on any publication the following: “Research in this publication was produced by the AC-LEEM at Harvard CNS that was purchased with NSF MRI Grant Award Number  DME-1828237”

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