The JEOL F200 is a field emission TEM/STEM.  TEM Resolution spec is 1 angstrom at 200kv 1.6A for STEM. The system can work at both 200kv and 80kv   It is equipped with a One View Camera,   Bright field and HAADAF detector for STEM as well as a JEOL EDS detector with Oxford instruments Aztec software as the user interface.   The F200 is also equipped with Serial EM to perform tomography with higher tilt limits when  a High tilt holder is used.  Standard holders are limited to lower tilt angles.