XRA-013
Micro-XRF system
Nanomaterials Facility
MAKE
IXRF Systems
MODEL
Atlas X
LOCATION
LISE B15E
Description: µXRF system for measuring elemental composition of solid, liquids, particles, and powders samples. Primary excitation source is Rh (50 W, 50 kV, 10 μm Ø spot). Secondary excitation source is Rh (4 W, 50kV, 100 μm Ø spot) for light element. Detection range is C-U. Mapping size: 300 mm x 400 mm. Iridium Ultra XRF Software Suite: Spectra is available on the processing PC.
Prerequisite: X-Ray Device Safety (EHS) at the Harvard Training Portal (https://trainingportalinfo.harvard.edu/)
Mac Hathaway
hathaway@cns.fas.harvard.edu
primary contact
Hao-Yu (Greg) Lin
hlin@cns.fas.harvard.edu